Optimal Planning of Failure-Step Stress Partially Accelerated Life Tests under Type II Censoring
نویسندگان
چکیده
Abstract This paper considers optimum plans for failure-step stress partially accelerated life tests with two stress levels under type-II censoring assuming Weibull distribution as a lifetime model. The optimum test plans determine the optimum proportion of test units failing at each stress according to a certain optimality criterion. The D-optimality criterion is considered. Some numerical illustrations are provided to illustrate the proposed procedure.
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تاریخ انتشار 2009